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Proceedings Paper

Research and development of heterodyne dispersion meter
Author(s): Shu-Jen Liao; Shinn-Fwu Wang; Ming-Hung Chiu; Chih-Wen Lai; Rong-Seng Chang
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Paper Abstract

A heterodyne dispersion meter based on total-internal reflection effects and common-path configuration is presented. It is used to measuring the dispersion power of an optical material or component for many applications in industries. The phase difference between S and P-polarizations at the total-internal reflection condition can be extracted and measured accurately by using heterodyne interferometry. The constants of dispersion formulas built by traditional ways could be revised by this method. It has some merits, such as, high resolution and stability, easy to operate, and real-time measurement.

Paper Details

Date Published: 10 February 2005
PDF: 8 pages
Proc. SPIE 5638, Optical Design and Testing II, (10 February 2005); doi: 10.1117/12.572661
Show Author Affiliations
Shu-Jen Liao, National Huwei Univ. of Science and Technology (Taiwan)
Shinn-Fwu Wang, National Central Univ. (Taiwan)
Ming-Hung Chiu, National Huwei Univ. of Science and Technology (Taiwan)
Chih-Wen Lai, National Huwei Univ. of Science and Technology (Taiwan)
Rong-Seng Chang, National Central Univ. (Taiwan)


Published in SPIE Proceedings Vol. 5638:
Optical Design and Testing II
Yongtian Wang; Zhicheng Weng; Shenghua Ye; Jose M. Sasian, Editor(s)

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