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Proceedings Paper

Laser conditioning and electronic defects of HfO2 and SiO2 thin films
Author(s): Mark R. Kozlowski; Michael C. Staggs; Frank Rainer; J. H. Stathis
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Paper Details

Date Published: 1 June 1991
PDF: 14 pages
Proc. SPIE 1441, Laser-Induced Damage in Optical Materials: 1990, (1 June 1991); doi: 10.1117/12.57234
Show Author Affiliations
Mark R. Kozlowski, Lawrence Livermore National Lab. (United States)
Michael C. Staggs, Lawrence Livermore National Lab. (United States)
Frank Rainer, Lawrence Livermore National Lab. (United States)
J. H. Stathis, IBM/Thomas J. Watson Research Ctr. (United States)


Published in SPIE Proceedings Vol. 1441:
Laser-Induced Damage in Optical Materials: 1990
Harold E. Bennett; Lloyd L. Chase; Arthur H. Guenther; Brian Emerson Newnam; M. J. Soileau, Editor(s)

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