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Proceedings Paper

Improved subpixel analysis algorithm for geometrical superresolution in miniature spectrometer
Author(s): Huaidong Yang; Li Xu; Qingsheng He; Shurong He; Guofan Jin
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Paper Abstract

This paper aims at reducing the bias distortion in familiar sub-pixel analysis algorithm in miniature spectrometer. The process of sub-pixel analysis is modeled and the fallibility in reported sub-pixel analysis algorithm is discussed. The discussion suggests that an important inducement for distortion is cumulated errors. Hence, an averaged sup-pixel analysis algorithm is put forward. According to the new algorithm, the same iteration is executed twice but in opposite directions and results of the same sub-pixels are averaged. Relative simulation indicates that compare with old ones the new algorithm reduces bias distortion by several times and contributes to an enhanced resolution and wavelength accuracy.

Paper Details

Date Published: 10 February 2005
PDF: 5 pages
Proc. SPIE 5638, Optical Design and Testing II, (10 February 2005); doi: 10.1117/12.572246
Show Author Affiliations
Huaidong Yang, Tsinghua Univ. (China)
Li Xu, Tsinghua Univ. (China)
Qingsheng He, Tsinghua Univ. (China)
Shurong He, Tsinghua Univ. (China)
Guofan Jin, Tsinghua Univ. (China)

Published in SPIE Proceedings Vol. 5638:
Optical Design and Testing II
Yongtian Wang; Zhicheng Weng; Shenghua Ye; Jose M. Sasian, Editor(s)

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