Share Email Print
cover

Proceedings Paper

Multishot ablation of thin films: sensitive detection of film/substrate transition by shockwave monitoring
Author(s): Hans Eckard Hunger; Stefan Petzoldt; H. Pietsch; Juergen Reif; Eckart Matthias
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Details

Date Published: 1 June 1991
PDF: 4 pages
Proc. SPIE 1441, Laser-Induced Damage in Optical Materials: 1990, (1 June 1991); doi: 10.1117/12.57223
Show Author Affiliations
Hans Eckard Hunger, Freie Univ. Berlin (Germany)
Stefan Petzoldt, Freie Univ. Berlin (Germany)
H. Pietsch, Freie Univ. Berlin (Germany)
Juergen Reif, Freie Univ. Berlin (Germany)
Eckart Matthias, Freie Univ. Berlin (Germany)


Published in SPIE Proceedings Vol. 1441:
Laser-Induced Damage in Optical Materials: 1990
Harold E. Bennett; Lloyd L. Chase; Arthur H. Guenther; Brian Emerson Newnam; M. J. Soileau, Editor(s)

© SPIE. Terms of Use
Back to Top