Share Email Print
cover

Proceedings Paper

Dynamic 3D profilometry with dual-acousto-optic fringe projection
Author(s): Xiang Peng; Jindong Tian; Peng Zhang; Linbin Wei; Wenjie Qiu; Enbang Li; Dawei Zhang
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A three-dimensional (3D) profilometry based on a dual-acousto-optic fringe projection is reported in this paper. The fringe projector is able to generate fringe patterns with different optical sensitivities and therefore can handle the object surface with complex geometry and topology. It is also qualified for video-rate 3-D profilometry of arbitrary shape objects. By using two acousto-optic deflectors (AODs), the projector can generate a time-series, frequency-varying fringe patterns by use of the AO interaction effect. The two AODs are driven by the radio frequency (RF) signal with the same frequency. Changing the RF frequency leads to the change of the period of fringe patterns and, therefore, different sensitivities. In practice, the changing rate of sesitivity is limited by the frame rate of the detector, e.g. CCD, so it makes a dynamic 3-D profilometry possible. Experimentally, we project a sequence of spatial frequency-varying fringe patterns onto the test object surface. Then, a CCD camera simultaneously acquires the phase-modulated fringe patterns accordingly. With a sequence of phase measurement in a progression of fringe periods, an enhanced scheme for phase unwrapping algorithm is implemented in a recursive manner. The object surface with complex geometry and topology can be reconstructed in this way. Experimental results are also given to validate this approach.

Paper Details

Date Published: 10 February 2005
PDF: 8 pages
Proc. SPIE 5638, Optical Design and Testing II, (10 February 2005); doi: 10.1117/12.572213
Show Author Affiliations
Xiang Peng, Shenzhen Univ. (China)
Tianjin Univ. (China)
Jindong Tian, Shenzhen Univ. (China)
Peng Zhang, Tianjin Univ. (China)
Linbin Wei, Tianjin Univ. (China)
Wenjie Qiu, Tianjin Univ. (China)
Enbang Li, Tianjin Univ. (China)
Dawei Zhang, Tianjin Univ. (China)


Published in SPIE Proceedings Vol. 5638:
Optical Design and Testing II
Yongtian Wang; Zhicheng Weng; Shenghua Ye; Jose M. Sasian, Editor(s)

© SPIE. Terms of Use
Back to Top