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Proceedings Paper

Evaluation of dislocation densities in HgCdTe films by high-resolution x-ray diffraction
Author(s): Qingxue Wang; Jianrong Yang; Yanfeng Wei; Weizheng Fang; Li He
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Paper Abstract

The dislocation densities in HgCdTe films grown on CdZnTe by Liquid Phase Epitaxy (LPE) are calculated based on their effects on the x-ray rocking curves. The dislocation densities derived from three kinds of methods, i.e. FWHM of X-ray double axis diffraction, Williamson-Hall plot and Pseudo-Voigt function, are approximately the same. It is found that the thickness of HgCdTe epilayers about 10 um is large enough so that effect of crystallize size on the rocking curves width can be ignored. Because the intrinsic FWHM of HgCdTe and the instrumental function of high resolution X-ray diffraction are neglected in Williamson-Hall plot and Pseudo-Voigt function, the dislocation densities obtained by these methods are a little larger than those derived from the first kind of method. Among three kinds of methods, Pseudo-Voigt function method is the easiest one to fit the rocking curves and calculate the dislocation densities.

Paper Details

Date Published: 10 January 2005
PDF: 8 pages
Proc. SPIE 5640, Infrared Components and Their Applications, (10 January 2005); doi: 10.1117/12.572209
Show Author Affiliations
Qingxue Wang, Shanghai Institute of Technical Physics, CAS (China)
Jianrong Yang, Shanghai Institute of Technical Physics, CAS (China)
Yanfeng Wei, Shanghai Institute of Technical Physics, CAS (China)
Weizheng Fang, Shanghai Institute of Technical Physics, CAS (China)
Li He, Shanghai Institute of Technical Physics, CAS (China)


Published in SPIE Proceedings Vol. 5640:
Infrared Components and Their Applications
Haimei Gong; Yi Cai; Jean-Pierre Chatard, Editor(s)

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