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Proceedings Paper

Defect enhancement of local electric fields in dielectric films
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Paper Abstract

Different film deposition techniques have been found to generate distinct grain morphologies and defect distributions, which can result in a wide distribution of local field intensities. We have developed a lattice element model of an inhomogeneous medium, which we use to selfconsistently determine the local internal electric field and polarization. We use this method to show the sensitivity of the polarization to defect shape. The results of this method predict the local field to have a large range of values within the film and have been used to identify regions where the local field is a maximum.

Paper Details

Date Published: 1 June 1991
PDF: 7 pages
Proc. SPIE 1441, Laser-Induced Damage in Optical Materials: 1990, (1 June 1991); doi: 10.1117/12.57214
Show Author Affiliations
Steven M. Risser, Pacific Northwest Lab. (United States)
Kim F. Ferris, Pacific Northwest Lab. (United States)

Published in SPIE Proceedings Vol. 1441:
Laser-Induced Damage in Optical Materials: 1990
Harold E. Bennett; Lloyd L. Chase; Arthur H. Guenther; Brian Emerson Newnam; M. J. Soileau, Editor(s)

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