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Proceedings Paper

Investigation of pit formation in multilayer optical storage disks using optical coherence tomography
Author(s): Yongjin Shin; Woonggyu Jung; Zhongping Chen; John Stuart Nelson; Hyunjin Kim; Jinseong Park
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Paper Abstract

We propose anovel application of optical coherence tomography (OCT) to monitor pit formation in laser irradiated optical storage materials. A multilayer optical storage recordable compact disk, is composed of multiple layers, each of different structure. Disks were irradiated with a Q-Switched Nd:YAG laser with an energy of 373 mJ. Post-irradiated disks were evaluated by OCT and those images were compared with optical microscopy. Our results indicate that OCT is a useful instrument to investigate pit formation in mulitlayer optical storage disks and might also provide information to optimize optical memory technology.

Paper Details

Date Published: 25 October 2004
PDF: 6 pages
Proc. SPIE 5604, Optomechatronic Micro/Nano Components, Devices, and Systems, (25 October 2004); doi: 10.1117/12.571760
Show Author Affiliations
Yongjin Shin, Chosun Univ. (South Korea)
Beckman Laser Institute/Univ. of California/Irvine (United States)
Woonggyu Jung, Beckman Laser Institute/Univ. of California/Irvine (United States)
Zhongping Chen, Beckman Laser Institute/Univ. of California/Irvine (United States)
John Stuart Nelson, Beckman Laser Institute/Univ. of California/Irvine (United States)
Hyunjin Kim, Chosun Univ. (South Korea)
Jinseong Park, Chosun Univ. (South Korea)


Published in SPIE Proceedings Vol. 5604:
Optomechatronic Micro/Nano Components, Devices, and Systems
Yoshitada Katagiri, Editor(s)

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