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Proceedings Paper

The reliability test of center-aperture-detection-type magnetically induced super-resolution magneto-optical disk
Author(s): Yoshihisa Suzuki; Sayoko Tanaka; Morio Nakatani; Satoshi Sumi; Sakae Tanemura
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Paper Abstract

The Center Aperture Detection (CAD) type Magnetically Induced Super-resolution (MSR) Magneto-optical Disk is one of method to overcome the limitation of optical resolution. For a reliability of the disk, it is important to investigate the stability of the magneto-static coupling between a readout layer and a recording layer through readout characteristics. In this paper, we tested the reliability of CAD tMSR magneto-optical disk. We used iD PHOTO disk for the CAD MSR magneto-optical disk. In the disk, the data is recorded on land and groove with a track pit of 0.6 µm and a bit length of 0.235 µm, by a method of laser pumped magnetic field modulation with an optical pickup of NA=0.62, λ=650 nm. The reliability was examined by PI error lines under the test condition of 80 °C-90 %RH. There were no considerable changes in read/write characteristics up to with an aging time of 2000 hour. The lifetime of the disk was estimated more than 7000 hour under the condition. By a method of the Arrhenius plots, we assumed that the lifetime of the disk would be more than 100 years under the condition of room temperature. We also confirmed that there were no significant changes in mechanical characteristics of the disks. These results show the disk using magneto-static coupling has sufficient reliability for consumer use.

Paper Details

Date Published: 3 January 2005
PDF: 7 pages
Proc. SPIE 5643, Advances in Optical Data Storage Technology, (3 January 2005); doi: 10.1117/12.571733
Show Author Affiliations
Yoshihisa Suzuki, Sanyo Electric Co., Ltd. (Japan)
Sayoko Tanaka, Sanyo Electric Co., Ltd. (Japan)
Morio Nakatani, Sanyo Electric Co., Ltd. (Japan)
Satoshi Sumi, Sanyo Electric Co., Ltd. (Japan)
Sakae Tanemura, Nagoya Institute of Technology (Japan)

Published in SPIE Proceedings Vol. 5643:
Advances in Optical Data Storage Technology
Duanyi Xu; Kees A. Schouhamer Immink; Keiji Shono, Editor(s)

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