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Proceedings Paper

Image bias correction in structured light sensor
Author(s): Qingying Hu; Kevin G. Harding; Donald Hamilton
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Paper Abstract

Structured light techniques have been used in a lot of applications. As a two-dimensional optical measurement method, structured light sensors are faster than one-dimensional point triangulation sensor while easier to calibrate and move than full-field three-dimensional sensors. The accuracy of structured light sensors mainly depends on the accuracy of both calibration and beam center extraction. In some applications with complicated surface shapes, the extracted center may not be the actual “true” center, which results in image bias. This paper presents a method to compensate the image bias and improve the measurement accuracy of structured light sensors. The basic concepts of image bias correction are given and some initial results are provided.

Paper Details

Date Published: 16 December 2004
PDF: 7 pages
Proc. SPIE 5606, Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology II, (16 December 2004); doi: 10.1117/12.571683
Show Author Affiliations
Qingying Hu, GE Global Research Ctr. (United States)
Kevin G. Harding, GE Global Research Ctr. (United States)
Donald Hamilton, GE Global Research Ctr. (United States)


Published in SPIE Proceedings Vol. 5606:
Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology II
Kevin G. Harding, Editor(s)

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