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Proceedings Paper

Six-port reflectometers for terahertz scattering parameter measurements using submillimeter-wavelength detectors
Author(s): Robert M. Weikle; Zhiyang Liu; Heng Liu; Lei Liu; Sadik Ulker; Arthur W. Lichtenberger
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Paper Abstract

The design, construction, and investigation of a reflectometer for measuring return loss magnitude and phase at submillimeter wavelengths is presented. The instrument, which consists of a section of rectangular waveguide and an ensemble of Schottky diode power detectors is designed as a proof-of-principle demonstration and is a relatively simple implementation of the six-port analyzer originally investigated by Engen and coworkers. Design considerations for the reflectometer are presented and measurements in the 270 GHz to 320 GHz range are discussed.

Paper Details

Date Published: 19 January 2005
PDF: 13 pages
Proc. SPIE 5592, Nanofabrication: Technologies, Devices, and Applications, (19 January 2005); doi: 10.1117/12.571418
Show Author Affiliations
Robert M. Weikle, Univ. of Virginia (United States)
Zhiyang Liu, Univ. of Virginia (United States)
Heng Liu, Univ. of Virginia (United States)
Lei Liu, Univ. of Virginia (United States)
Sadik Ulker, Girne American Univ. (Cyprus)
Arthur W. Lichtenberger, Univ. of Virginia (United States)

Published in SPIE Proceedings Vol. 5592:
Nanofabrication: Technologies, Devices, and Applications
Warren Y-C. Lai; Stanley Pau; O. Daniel Lopez, Editor(s)

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