Share Email Print
cover

Proceedings Paper

Tunable stiffness scanning microscope probe
Author(s): Clemens Mueller-Falcke; Yong-Ak Song; Sang-Gook Kim
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Scanning probe microscopy (SPM) has been an important tool to image and manipulate micro/nano scale structures. The measurement is based on the optical detection of a very small deflection of a flexible cantilever while traveling near the sample surface. However, the use of a cantilever with a sharp oxidized conical tip is quite costly, very difficult to scale up and unable to scan variable hardness surfaces, such as cell membranes in vivo. A concept of in-plane probe tip is developed. It has a carbon nanotube tip, built-in actuator and a tip deflection sensor, all assembled in the same plane. Most of all, an in-plane probe design would enable the stiffness of the probe to become tunable by using MEMS clutched springs. This allows a continuous measurement of samples with inhomogeneous surface hardness without changing the probe in the middle of a measurement.

Paper Details

Date Published: 25 October 2004
PDF: 7 pages
Proc. SPIE 5604, Optomechatronic Micro/Nano Components, Devices, and Systems, (25 October 2004); doi: 10.1117/12.571273
Show Author Affiliations
Clemens Mueller-Falcke, Massachusetts Institute of Technology (United States)
Yong-Ak Song, Massachusetts Institute of Technology (United States)
Sang-Gook Kim, Massachusetts Institute of Technology (United States)


Published in SPIE Proceedings Vol. 5604:
Optomechatronic Micro/Nano Components, Devices, and Systems
Yoshitada Katagiri, Editor(s)

© SPIE. Terms of Use
Back to Top