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Proceedings Paper

Planar laser light scattering technique for measurement of nonspherical particles
Author(s): Hyun Woo Kim; Man Soo Choi; Dae Hwa Jeong; Hyo Hyung Lee
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Paper Abstract

Small particles are one of the biggest sources that cause loss in semiconductor and flat panel display industry. Therefore, it is important to control them during their manufacturing process. To achieve this goal, exact measurement of particles is first required. Laser light scattering is the most widely used technique for diagnosis of particles because it does not disturb flow field and enables real time and spatially resolved analysis. Measurement of nonspherical aggregates comprised of small primary particles is difficult compared with spherical particles because they have very complex morphology. In addition, most researches on aggregates using light scattering are limited to point measurement, which requires much time to inspect large area and is difficult to observe unsteady phenomenon. Motivated by this, we have developed a laser light scattering method for simultaneous measurement of spatial distributions of aggregate size and morphology. Silica aggregates that were generated in Methane/air premixed flame were used as test particles. Multiangular planar light scattering measurement was carried out using a sheet beam of Ar ion laser and an intensified charge coupled device (ICCD) camera as a light source and a detector, respectively. The result was interpreted based on the Rayleigh-Debye-Gans scattering theory for fractal aggregates to obtain the mean radius of gyration and fractal dimension that are the parameters characterizing aggregate size and morphology. The suitability of our new technique was confirmed by experiment using conventional light scattering.

Paper Details

Date Published: 25 October 2004
PDF: 11 pages
Proc. SPIE 5602, Optomechatronic Sensors, Actuators, and Control, (25 October 2004); doi: 10.1117/12.571193
Show Author Affiliations
Hyun Woo Kim, LG Electronics Inc. (South Korea)
Man Soo Choi, Seoul National Univ. (South Korea)
Dae Hwa Jeong, LG Electronics Inc. (South Korea)
Hyo Hyung Lee, LG Electronics Inc. (South Korea)


Published in SPIE Proceedings Vol. 5602:
Optomechatronic Sensors, Actuators, and Control
Kee S. Moon, Editor(s)

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