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Proceedings Paper

Research and development of cadmium zinc telluride substrates for mercury cadmium telluride epitaxial films
Author(s): Hui Huang; Rui-min Wan; Zeng-lin Zhao; Quan-lin Yue; Rong-bin Ji; Shun-chen Pan
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Paper Abstract

Cadmium zinc telluride (Cd1-yZnyTe) single crystals are important material for infrared detectors fabricating process and radiation detectors. Cd1-yZnyTe crystal wafers are widely used as substrate to grow epitaxial layers of mercury cadmium telluride (Hg1-xCdxTe) that is an important process for infrared detectors with high resolution. Especially, Cd1-yZnyTe with small concentrations (y=0.03~0.04) is favored for this purpose since the lattice constant of Cd1-yZnyTe (y=0.03~0.04) is close to that of Hg0.8Cd0.2Te, which has a bandgap corresponding to 10 micron. These applications impose certain requirements on the Cd1-yZnyTe crystals. Impurity concentrations should be low, especially for Cu, which can readily diffuse into the epitaxial layer and alter its electrical properties. Dislocation etch pit density should be low, typically no more than 1×105 cm-2. Infrared transmission should be high, usually greater than 60%, from 2.5 to 20 μm. Precipitates, visible as dark spots in infrared transmission microscopy, should be no larger than 10μm in diameter, and their density no higher than 0.5×105~1×105 cm-2. This paper reports results on how these requirements can be met by our research and development works in Kunming institute of physics mainly through controlling the cadmium atmosphere pressure in the quartz ampoule.

Paper Details

Date Published: 10 January 2005
PDF: 7 pages
Proc. SPIE 5640, Infrared Components and Their Applications, (10 January 2005); doi: 10.1117/12.570660
Show Author Affiliations
Hui Huang, Kunming Institute of Physics (China)
Rui-min Wan, Kunming Institute of Physics (China)
Zeng-lin Zhao, Kunming Institute of Physics (China)
Quan-lin Yue, Kunming Institute of Physics (China)
Rong-bin Ji, Kunming Institute of Physics (China)
Shun-chen Pan, Kunming Institute of Physics (China)


Published in SPIE Proceedings Vol. 5640:
Infrared Components and Their Applications
Haimei Gong; Yi Cai; Jean-Pierre Chatard, Editor(s)

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