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Proceedings Paper

Annular subaperture interferometric testing technique for large aspheric surfaces
Author(s): Xi Hou; Fan Wu; Shibin Wu; Qiang Chen
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Paper Abstract

A new method to test large aspheric surface by using Annular Sub-aperture Interferometric Testing (ASIT) is described in this paper. It solves the two main difficulties, which are manufacture difficulty and high cost of auxiliary elements (optics compensator, CGH, large reflector) used generally in testing the large aspheric mirror. The method reduces departure between the reference wavefront and tested wavefront to the measurement range of the interferometer by testing annular subaperture of aspheric surface, which makes reference wavefronts with different curvature radius match corresponding annular subaperture, then sews all sub-aperture datum together with a suitable algorithm to get the whole information of the surface. A stitching mathematics model is provided. The feasibility of the technique has been demonstrated by comparing test results from an autocollimation test and ASIT of an 152-mm diameter paraboloidal mirror. This method extends the dynamic range of interferometric measurements, by which the large, fast aspheric surface can be directly tested without additional optical elements.

Paper Details

Date Published: 10 February 2005
PDF: 6 pages
Proc. SPIE 5638, Optical Design and Testing II, (10 February 2005); doi: 10.1117/12.570188
Show Author Affiliations
Xi Hou, Institute of Optics and Electronics, CAS (China)
Graduate School of the Chinese Academy of Sciences (China)
Fan Wu, Institute of Optics and Electronics, CAS (China)
Shibin Wu, Institute of Optics and Electronics, CAS (China)
Qiang Chen, Institute of Optics and Electronics, CAS (China)

Published in SPIE Proceedings Vol. 5638:
Optical Design and Testing II
Yongtian Wang; Zhicheng Weng; Shenghua Ye; Jose M. Sasian, Editor(s)

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