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Proceedings Paper

Blue-ray-induced optical properties of noble metal oxide thin film in super-RENS disk
Author(s): Qian Liu; Toshio Fukaya; Junji Tominaga
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Paper Abstract

The optical reflectance and transmittance of Platinum oxide (PtOx) and palladium oxide (PdOx) mask layer, which are used to super-resolution near-field structure (super-RENS) disk, are investigated using Z-scan technique, under blue laser (442 nm) irradiation. The power thresholds of the PtOx and PdOx decomposition are obtained; the reversible and irreversible features for the two kinds of mask layers are cleared. Deformation in the micro irradiation region on surface of the mask samples, which is formed by decomposition of the PtOx or PdOx driving the Z-scan, is analyzed by means of an atom force microscope (AFM). The deformation analyses agree well with the Z-scan results. The optical features obtained at 442nm wavelength are compared with those at 532-nm wavelength, and the power threshold difference between the two wavelengths is also analyzed in detail based on irradiation power density and absorption spectrum of the mask samples.

Paper Details

Date Published: 3 January 2005
PDF: 10 pages
Proc. SPIE 5643, Advances in Optical Data Storage Technology, (3 January 2005); doi: 10.1117/12.570121
Show Author Affiliations
Qian Liu, National Institute of Advanced Industrial Science and Technology (Japan)
Toshio Fukaya, National Institute of Advanced Industrial Science and Technology (Japan)
Junji Tominaga, National Institute of Advanced Industrial Science and Technology (Japan)


Published in SPIE Proceedings Vol. 5643:
Advances in Optical Data Storage Technology
Duanyi Xu; Kees A. Schouhamer Immink; Keiji Shono, Editor(s)

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