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Proceedings Paper

Full-range linear birefringence mapping: application to the characterization of half-wave plate
Author(s): Hui-Kang Teng; Kuo-Chen Lang; Chun-Chen Yen
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Paper Abstract

In this investigation, an interferometric scheme is developed to determine the linear birefringent parameters of wave plate in full range. A commercially available Soliel Babinet compensator and a half wave plate are taken as sample to demonstrate the capability of two-dimensional measurement. Since images are obtained with respect to different polarization orientations of a linearly polarized incident laser beam, the measurement speed can be improved once the polarization orientation adjustment is achieved electronically. The measurement is also independent of non-uniform distribution of laser intensity, this is demonstrated experimentally and briefly explained theoretically. In addition, the 2-D distribution of residual linear birefringent parameters is also demonstrated.

Paper Details

Date Published: 14 February 2005
PDF: 11 pages
Proc. SPIE 5634, Advanced Sensor Systems and Applications II, (14 February 2005); doi: 10.1117/12.570056
Show Author Affiliations
Hui-Kang Teng, Nan-Kai Institute of Technology (Taiwan)
Kuo-Chen Lang, Nan-Kai Institute of Technology (Taiwan)
Chun-Chen Yen, Nan-Kai Institute of Technology (Taiwan)


Published in SPIE Proceedings Vol. 5634:
Advanced Sensor Systems and Applications II
Yun-Jiang Rao; Osuk Y. Kwon; Gang-Ding Peng, Editor(s)

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