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Proceedings Paper

Design and fabrication of digital dual-frequency patterns for projected fringe profilometry
Author(s): Wei-Hung Su; Yi-Ling Hsu; Cho-Yo Kuo; Hong-Ming Chen; Wei-Chen Su; Shizhuo Yin
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Paper Abstract

One key problem of fringe projection techniques for 3D shape measurements is the limited phase unambiguity range when only one grating period is used. Dual-frequency patterns in which involves two grating periods can easily extend the unambiguity range. A method to fabricate accurate dual-frequency patterns is presented. The advantage of using digital dual-frequency patterns for projected fringe profilometry are (1) high geometrical accuracy (< 0.5μm); (2) high contrast ratio; (3) very low high order harmonic distortions; and (4) extended unambiguity range.

Paper Details

Date Published: 16 December 2004
PDF: 10 pages
Proc. SPIE 5606, Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology II, (16 December 2004); doi: 10.1117/12.569992
Show Author Affiliations
Wei-Hung Su, National Sun Yat-Sen Univ. (Taiwan)
Yi-Ling Hsu, National Sun Yat-Sen Univ. (Taiwan)
Cho-Yo Kuo, National Sun Yat-Sen Univ. (Taiwan)
Hong-Ming Chen, National Sun Yat-Sen Univ. (Taiwan)
Wei-Chen Su, National Sun Yat-Sen Univ. (Taiwan)
Shizhuo Yin, The Pennsylvania State Univ. (United States)


Published in SPIE Proceedings Vol. 5606:
Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology II
Kevin G. Harding, Editor(s)

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