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Proceedings Paper

Influence of the bandwidth of an acquisition system on the trap stiffness measurement
Author(s): Zan Gong; Hongtao Chen; Shenghua Xu; Yinmei Li; Liren Lou
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Paper Abstract

The high precision calibration of optical trap stiffness is the foundation of the weak force measurement in optical tweezers system. And the accuracy of the trap stiffness measurement is limited by the bandwidth of the acquisition system. In this article, such an influence is analyzed and discussed. First, the power spectrum of the thermal motion of a trapped bead is analyzed and the true trap stiffness is compared with the stiffness measured by a limited bandwidth acquisition system. Then the stiffness measuring process is simulated using Monte Carlo method when thermal motion analysis method is used to measure the trap stiffness. It is demonstrated that the influence of the bandwidth is related to the trap stiffness and bead diameter. And that the measured trap stiffness is greater than the true value is also demonstrated when the bandwidth of the acquisition system is not sufficient.

Paper Details

Date Published: 9 February 2005
PDF: 4 pages
Proc. SPIE 5635, Nanophotonics, Nanostructure, and Nanometrology, (9 February 2005); doi: 10.1117/12.569877
Show Author Affiliations
Zan Gong, Univ. of Science and Technology of China (China)
Hongtao Chen, Univ. of Science and Technology of China (China)
Shenghua Xu, Univ. of Science and Technology of China (China)
Yinmei Li, Univ. of Science and Technology of China (China)
Liren Lou, Univ. of Science and Technology of China (China)


Published in SPIE Proceedings Vol. 5635:
Nanophotonics, Nanostructure, and Nanometrology
Xing Zhu; Stephen Y. Chou; Yasuhiko Arakawa, Editor(s)

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