Share Email Print

Proceedings Paper

Imaging quality analysis of KBA x-ray microscope working at grazing incidence
Author(s): Jiasheng Hu; Lingling Zhao; Xiang Li; Xu Wu; Yuhong Bai
Format Member Price Non-Member Price
PDF $17.00 $21.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

In the latest 20 years, x-ray imaging technology has developed fast in order to meet the need of x-ray photo-etching, spatial exploration technology, high-energy physics, procedure diagnosis of inertial confinement fusion (ICF) et al. Since refractive index of materials in the x-ray region is lower than 1, and x-ray is strongly absorbed by materials, it is very difficult to image objects in the x-ray region. Conventional imaging methods are hardly suitable to x-ray range. In general, grazing reflective imaging and coding aperture imaging methods have been adopted more and more. In this paper, according to user’s requirement, we have designed a non-coaxial grazing KBA microscope. The microscope consists of two sets of perpendicular spherical mirrors, each set includes two parallel mirrors. Taking it as an example, we have compiled an optical computing program for the non-coaxial grazing imaging systems so as to analyze and evaluate aberrations of KBA microscope. Thus it can help us to get an optimal comprehension of KBA x-ray imaging system. In the same time, the analytical results provide reliable foundation for evaluating imaging quality of KBA microscope.

Paper Details

Date Published: 10 February 2005
PDF: 6 pages
Proc. SPIE 5638, Optical Design and Testing II, (10 February 2005); doi: 10.1117/12.569742
Show Author Affiliations
Jiasheng Hu, Dalian Univ. of Technology (China)
Lingling Zhao, Dalian Univ. of Technology (China)
Xiang Li, Dalian Univ. of Technology (China)
Xu Wu, Dalian Univ. of Technology (China)
Yuhong Bai, Changchun Institute of Optics, Fine Mechanics and Physics, CAS (China)

Published in SPIE Proceedings Vol. 5638:
Optical Design and Testing II
Yongtian Wang; Zhicheng Weng; Shenghua Ye; Jose M. Sasian, Editor(s)

© SPIE. Terms of Use
Back to Top