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Proceedings Paper

Automated critical dimension and registration communication
Author(s): Paul DePesa; Todd E. Pegelow
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Paper Details

Date Published: 1 January 1992
PDF: 8 pages
Proc. SPIE 1604, 11th Annual BACUS Symposium on Photomask Technology, (1 January 1992); doi: 10.1117/12.56932
Show Author Affiliations
Paul DePesa, Diamon Images (United States)
Todd E. Pegelow, Transcription Enterprises Ltd. (United States)


Published in SPIE Proceedings Vol. 1604:
11th Annual BACUS Symposium on Photomask Technology
Kevin C. McGinnis, Editor(s)

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