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Proceedings Paper

Irradiation effects in electronic components of the RPC trigger for the CMS experiment
Author(s): Karol Bunkowski; Ivan I.K. Kassamakov; J. Krolikowski; Krzysztof Kierzkowski; Maciej Ignacy Kudla; Teppo Maenpaa; Krzysztof T. Pozniak; Dominik Rybka; Eija Tuominen; Donatella Ungaro; Wojciech M. Zabolotny
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Paper Abstract

The results of proton radiation test of electronic devices for RPC trigger electronic system of CMS detector are presented. For Xilinx Spartan-IIE FPGA the cross section for Single Event Upsets (SEUs) in configuration bits was measured. The dynamic SEUs in flip-flops was also investigated, but not observed. For the FLASH memories no single upsets were detected, but after a huge dose permanent damages of devices were observed. For SDRAM memories, the SEU cross section was measured. A brief description of radiation inducted effects in FPGAs, SRAM and FLASH memories is also presented.

Paper Details

Date Published: 22 July 2004
PDF: 12 pages
Proc. SPIE 5484, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments II, (22 July 2004); doi: 10.1117/12.568897
Show Author Affiliations
Karol Bunkowski, Warsaw Univ. (Poland)
Ivan I.K. Kassamakov, Univ. of Helsinki (Finland)
J. Krolikowski, Warsaw Univ. (Finland)
Krzysztof Kierzkowski, Warsaw Univ. (Poland)
Maciej Ignacy Kudla, Warsaw Univ. (Poland)
Teppo Maenpaa, Univ. of Helsinki (Finland)
Krzysztof T. Pozniak, Warsaw Univ. of Technology (Poland)
Dominik Rybka, Warsaw Univ. of Technology (Poland)
Eija Tuominen, Univ. of Helsinki (Finland)
Donatella Ungaro, Univ. of Helsinki (Finland)
Wojciech M. Zabolotny, Warsaw Univ. of Technology (Poland)


Published in SPIE Proceedings Vol. 5484:
Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments II
Ryszard S. Romaniuk, Editor(s)

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