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Proceedings Paper

Passive and active thermal nondestructive imaging of materials
Author(s): Nicolas P. Avdelidis; Antonia Moropoulou; Darryl P. Almond
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Paper Abstract

Thermal non-destructive approaches, passive and active, are widely used due to the outstanding advantages that offer in a number of applications and particularly for the assessment of materials and structures. In this work, different applications, employing either MWIR or LWIR thermographic testing, as well as passive and/or active approaches, depending on the application, concerning the assessment of various materials are presented. In a few instances, thermal modelling is also discussed and compared with the outcome of experimental testing. The following applications are reviewed: • Emissivity measurements. • Moisture impact assessment in porous materials. • Evaluation of conservation interventions, concerning: - Consolidation interventions on porous stone. - Cleaning of architectural surfaces. • Assessment of airport pavements. • Investigation of repaired aircraft panels. • Through skin sensing assessment on aircraft composite structures. Real time monitoring of all features was obtained using passive imaging or transient thermographic analysis (active imaging). However, in the composite repairs and through skin imaging cases thermal modelling was also used with the intention of providing supplementary results, as well as to demonstrate the importance of thermal contact resistance between two surfaces (skin and strut in through skin sensing). Finally, in order to obtain useful information from the surveys, various properties (thermal, optical, physical) of the examined materials were taken into account.

Paper Details

Date Published: 6 December 2004
PDF: 15 pages
Proc. SPIE 5612, Electro-Optical and Infrared Systems: Technology and Applications, (6 December 2004); doi: 10.1117/12.568749
Show Author Affiliations
Nicolas P. Avdelidis, Technical Chamber of Greece (Greece)
Antonia Moropoulou, National Technical Univ. of Athens (Greece)
Darryl P. Almond, Univ. of Bath (United Kingdom)


Published in SPIE Proceedings Vol. 5612:
Electro-Optical and Infrared Systems: Technology and Applications
Ronald G. Driggers; David A. Huckridge, Editor(s)

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