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Proceedings Paper

An automatic system for measurement of retardation of wave plates based on phase-shifted method
Author(s): Zhishan Gao; Ming Yan
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Paper Abstract

A practical system is described to measure the retardation of wave plates with phase-shifted method. The tested wave plate is put in and the original angle between the axis of it and the analyzer is random, not 45 degree. For the measurement is made rapidly and automatically, a standard wave plate act as a compensator, the stepping motor is used to drive the analyzer to realize phase shifting and a grating encoder is used to measure its rotating angle. At the same time, while the beam comes out from the analyzer, the photoelectric detector gets its intensity, and then the signals is magnified, filtered and sent to computer through its serial port. The results show the system has the advantages of costing little time and high accuracy.

Paper Details

Date Published: 10 February 2005
PDF: 5 pages
Proc. SPIE 5638, Optical Design and Testing II, (10 February 2005); doi: 10.1117/12.568719
Show Author Affiliations
Zhishan Gao, Nanjing Univ. of Science and Technology (China)
Ming Yan, No. 514 Institute of the 5th Academy China Aerospace Science and Technology Corp. (China)

Published in SPIE Proceedings Vol. 5638:
Optical Design and Testing II
Yongtian Wang; Zhicheng Weng; Shenghua Ye; Jose M. Sasian, Editor(s)

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