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Proceedings Paper

Microscopy of Si and Ge nanospherical particles
Author(s): Uryi Petrovich Volkov; Vil B. Baibyrin; Roman A. Yakimenko; Nikolai P. Konnov; Andrei P. Mironychev
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Paper Abstract

We have fabricated nanometer spherical silicon and germanium particles by dissolving semiconductors in some melted metals (aluminum, indium). The first transmission electron microscopy images and electron microdiffraction patterns of the spherical Si and Ge particles are presented. The obtained spherical particles have sizes from hundreds nanometers to tens angstroms, the diameters of the smallest ones are about 1.5 nm that are close to calculated sizes of hypothetic silicon "fullerenes" Si60.

Paper Details

Date Published: 14 July 2004
PDF: 5 pages
Proc. SPIE 5475, Saratov Fall Meeting 2003: Coherent Optics of Ordered and Random Media IV, (14 July 2004); doi: 10.1117/12.568563
Show Author Affiliations
Uryi Petrovich Volkov, Saratov State Technical Univ. (Russia)
Vil B. Baibyrin, Saratov State Technical Univ. (Russia)
Roman A. Yakimenko, Saratov State Technical Univ. (Russia)
Nikolai P. Konnov, Russian Research Anti-Plague Institute (Russia)
Andrei P. Mironychev, Institute of Radioengineering and Electronics (Russia)


Published in SPIE Proceedings Vol. 5475:
Saratov Fall Meeting 2003: Coherent Optics of Ordered and Random Media IV
Dmitry A. Zimnyakov, Editor(s)

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