Share Email Print
cover

Proceedings Paper

Application of OBIC and photoluminescence to the failure analysis of laser diode devices
Author(s): Giuseppe A. Azzini; R. De Franceschi; M. Liberatore; Laura Serra; Paolo Montangero
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The use of optical beam induced current (OBIC) and photoluminescence (PL) imaging is a valuable tool for failure analysis of laser diodes. Examples of applications to three different types of lasers demonstrate the effectiveness of the approach and the high resolution attainable. Differences with the more popular SEM techniques are also discussed.

Paper Details

Date Published: 1 February 1992
PDF: 6 pages
Proc. SPIE 1620, Laser Testing and Reliability, (1 February 1992); doi: 10.1117/12.56856
Show Author Affiliations
Giuseppe A. Azzini, Centro Studi e Lab. Telecomunicazioni SpA (Italy)
R. De Franceschi, Centro Studi e Lab. Telecomunicazioni SpA (Italy)
M. Liberatore, Centro Studi e Lab. Telecomunicazioni SpA (Italy)
Laura Serra, Centro Studi e Lab. Telecomunicazioni SpA (Italy)
Paolo Montangero, Centro Studi e Lab. Telecomunicazioni SpA (Italy)


Published in SPIE Proceedings Vol. 1620:
Laser Testing and Reliability
David L. Begley; S. C. Wang, Editor(s)

© SPIE. Terms of Use
Back to Top