Share Email Print
cover

Proceedings Paper

Continuous vibration monitoring system at an operating microelectronics fabrication plant
Author(s): Goutam Paul; Rajesh Mehta
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Various construction activities were planned in an area next to Intel''s sub-micron microelectronics facility in Santa Clara. We needed to develop a system to ensure the continued operation of the process equipment during construction without any yield problems due to transmission of construction-related vibrations. A computer-based vibration monitoring system was devised and built which provides continuous measurements and is suitable for ''interactive'' as well as for ''archive'' use. In ''interactive'' use, alarm levels are set at two threshold values which were chosen from operating fabrication plant characteristics. Continuous data generation and its analysis with respect to the construction related activities gives a clear indication of harmful construction activities and equipment. The transmission ability of vibration through the existing type of soil and isolated grade slab construction is also studied. The dampening or amplifications of vibration levels with respect to location and distance from the source has been characterized and evaluated.

Paper Details

Date Published: 1 February 1992
PDF: 12 pages
Proc. SPIE 1619, Vibration Control in Microelectronics, Optics, and Metrology, (1 February 1992); doi: 10.1117/12.56852
Show Author Affiliations
Goutam Paul, Intel Corp. (United States)
Rajesh Mehta, Intel Corp. (United States)


Published in SPIE Proceedings Vol. 1619:
Vibration Control in Microelectronics, Optics, and Metrology
Colin G. Gordon, Editor(s)

© SPIE. Terms of Use
Back to Top