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Proceedings Paper

Refractive-index measurement of high-refractive-index integrated-optic components
Author(s): Philippe Oberson
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Paper Abstract

The most commonly-used technique for measuring the refractive index profile of an optical fiber is the refracted near-field method. This standard method cannot be directly used for integrated optical waveguides such as silica-on-silicon or LiNbO3 because of the geometrical constraints imposed by the slab waveguide. A modified method was described in previous work and subsequently implemented with some improvements (e.g. use of a calibrated solid refractive-index reference element; a simplified waveguide identification) in a commercial apparatus. However, the non-availability of suitable index-matching liquids having an index of refraction greater than about 1.8 prevent this apparatus being used with high-index DUTs. In this paper, we propose and experimentally verify a modified instrument that permits the characterization of the index profile of high refractive-index waveguides such as LiNbO3. Provided that the waveguide is written in a homogeneous bulk substrate with a known index, this modified approach allows for spatial and refractive-index resolutions that are practically as good as those obtained with the standard technique applied to optical fibers.

Paper Details

Date Published: 20 December 2004
PDF: 12 pages
Proc. SPIE 5577, Photonics North 2004: Optical Components and Devices, (20 December 2004); doi: 10.1117/12.568332
Show Author Affiliations
Philippe Oberson, EXFO Electro-Optical Engineering Inc. (Canada)


Published in SPIE Proceedings Vol. 5577:
Photonics North 2004: Optical Components and Devices
John C. Armitage; Simon Fafard; Roger A. Lessard; George A. Lampropoulos, Editor(s)

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