Share Email Print
cover

Proceedings Paper

Stability and vibration control in synchrotron light source buildings
Author(s): Jules B. Godel
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Synchrotron light sources have undergone three generations of development in the last two decades. The National Synchrotron Light Source (NSLS) at Brookhaven National Laboratory has two "second generation" storage rings that currently provide the world's most intense sources of photons in the VUV and X-ray spectral ranges. There are almost 90 beam lines serving a community of 2600 scientists from 370 institutions. They are engaged in basic and applied research in physics, chemistry, biology, medicine, materials science and various technologies. When design of the NSLS began in 1977, emphasis was given to the stability of the concrete slab on which the storage rings and experimental beam lines were placed. Stability is the result of controlling: . vibration from sources internal and external to the building, . thermal effects of air and water temperature variations, . foundation settlement and contact between the slab and underlying subsoil. With the advent of new research where highly focused beams of x-rays must be placed on increasingly smaller targets located 35 meters or more from the source, and the development of x-ray lithography with resolutions approaching 0. 1 micron at chip exposure stations, even greater attention to stability is required in building designs.

Paper Details

Date Published: 1 February 1992
PDF: 12 pages
Proc. SPIE 1619, Vibration Control in Microelectronics, Optics, and Metrology, (1 February 1992); doi: 10.1117/12.56833
Show Author Affiliations
Jules B. Godel, Brookhaven National Lab. (United States)


Published in SPIE Proceedings Vol. 1619:
Vibration Control in Microelectronics, Optics, and Metrology
Colin G. Gordon, Editor(s)

© SPIE. Terms of Use
Back to Top