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Proceedings Paper

Self-focusing x-ray spectrometer using mica as the dispersive element
Author(s): Xiancai Xiong; Xianxin Zhong; Shali Xiao; Zhongwei Hu; Jiayu Qian
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Paper Abstract

A new crystal spectrometer has been designed and fabricated for measuring laser-plasma x-ray in the 0.99-1.83-nm region. The cleaved mica crystal with 0.2-mm thickness was curved and glued on an elliptical substrate as the dispersive element. The x-ray source and exit slit are respectively placed at the first and second focal point of the elliptical crystal. The x-ray is diffracted by the mica crystal and focused at the exit slit. An x-ray sensitive charge coupled device or streak camera can be easily amounted in the perpendicular orientation to record the space and time resolved x-ray spectra. The spectrometer was tested at the XG-2 laser facility, and the experimental result shows that the maximum spectral resolution is 999.

Paper Details

Date Published: 10 February 2005
PDF: 6 pages
Proc. SPIE 5638, Optical Design and Testing II, (10 February 2005); doi: 10.1117/12.567896
Show Author Affiliations
Xiancai Xiong, Chongqing Univ. (China)
Xianxin Zhong, Chongqing Univ. (China)
Shali Xiao, Chongqing Univ. (China)
Zhongwei Hu, Beijing Univ. of Technology (China)
Jiayu Qian, Chongqing Univ. (China)


Published in SPIE Proceedings Vol. 5638:
Optical Design and Testing II
Yongtian Wang; Zhicheng Weng; Shenghua Ye; Jose M. Sasian, Editor(s)

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