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Proceedings Paper

Sensing properties of surface plasmon resonance in different multilayer Si-based structures
Author(s): Sergiy Patskovsky; Andrei V. Kabashin; Michel Meunier; John H.T. Luong
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Paper Abstract

The progress in the development of Si-based Surface Plasmon Resonance sensing technology is reported. This technology uses multi-layer structures with a gold film and a silicon prism in the Kretschmann-Raether geometry and makes potentially possible the miniaturization and integration of the sensor device on a silicon-based microplatform. We show conditions of the simultaneous excitation for two plasmon polariton modes over both sides of the gold film using different intermediate layers, between the high-refractive index silicon prism and the gold, and examine their response in configurations of the conventional and nanoparticle-enhanced sensing. The system has been calibrated in real-time measurements of protein (Concanavalin A) adsorption.

Paper Details

Date Published: 20 December 2004
PDF: 7 pages
Proc. SPIE 5577, Photonics North 2004: Optical Components and Devices, (20 December 2004); doi: 10.1117/12.567689
Show Author Affiliations
Sergiy Patskovsky, Ecole Polytechnique de Montreal (Canada)
Andrei V. Kabashin, Ecole Polytechnique de Montreal (Canada)
Michel Meunier, Ecole Polytechnique de Montreal (Canada)
John H.T. Luong, Biotechnology Research Institute/NRC (Canada)


Published in SPIE Proceedings Vol. 5577:
Photonics North 2004: Optical Components and Devices

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