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Proceedings Paper

The effect of boundary thermal resistance on HD DVD-ARW optical recording media
Author(s): Tsukasa Nakai; Sumio Ashida; Kenji Todori; Keiichiro Yusu; Katsutaro Ichihara; Shin'ichi Tatsuta; Naoyuki Taketoshi; Tetsuya Baba
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Paper Abstract

Thermal conductivities and boundary thermal resistances of thin films having the thickness of the order of ten nanometers were measured by using the thermo-reflectance method at room temperature. A thermal simulation of HD DVD-ARW (the next-generation advanced rewritable DVD) media was carried out to clarify the effect of boundary thermal resistance at the interface of those films. The thermal conductivity of thin films greatly depends on film thickness. The result of the thermal simulation depends significantly on whether the boundary thermal resistance is considered or not. Thus it is important to consider the boundary thermal resistances and using thermal properties of thin films to perform more accurate calculation for the phase change recording media. The results of the thermal simulation also suggested that the boundary thermal resistances dominate the thermal diffusion and response of the medium.

Paper Details

Date Published: 9 September 2004
PDF: 10 pages
Proc. SPIE 5380, Optical Data Storage 2004, (9 September 2004); doi: 10.1117/12.567626
Show Author Affiliations
Tsukasa Nakai, Toshiba Corp. (Japan)
Sumio Ashida, Toshiba Corp. (Japan)
Kenji Todori, Toshiba Corp. (Japan)
Keiichiro Yusu, Toshiba Corp. (Japan)
Katsutaro Ichihara, Toshiba Corp. (Japan)
Shin'ichi Tatsuta, Toshiba Corp. (Japan)
Naoyuki Taketoshi, National Institute of Advanced Industrial Science and Technology (Japan)
Tetsuya Baba, National Institute of Advanced Industrial Science and Technology (Japan)


Published in SPIE Proceedings Vol. 5380:
Optical Data Storage 2004
B. V. K. Vijaya Kumar; Hiromichi Kobori, Editor(s)

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