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Proceedings Paper

Transparency current density of GaInNAs lasers
Author(s): Greg Pakulski; James A. Gupta; Pedro J. Barrios; Andre Delage; Daniel Poitras; Xiaohua Wu; Edith Post; Zbigniew R. Wasilewski
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Paper Abstract

Transparency current density (Jtr) was studied in GaInNAs ridge waveguide lasers. The devices employ Ga1-xInxNyAs1-y multiple quantum wells and were grown on GaAs substrates using solid-source molecular beam epitaxy (MBE) with an RF plasma cell. The transparency current density is sensitive to material quality: defects, traps and other sources of non-radiative recombination. It is also dependent on the rate of thermionic emission from quantum wells. Wavelength, polarization and temperature dependence of transparency carrier density of annealed material was studied. Record low transparency carrier densities of 20 and 90 A/cm2/well were observed (for TM and TE polarizations) in devices based on GaInNAs material designed for emission at 1340 nm after optimized rapid thermal annealing. This low value of Jtr confirms the excellent quality of the GaInNAs material and demonstrates that GaInNAs lasers with excellent material properties can be grown for long wavelength applications provided appropriate annealing is applied. It is believed that the low transparency current density is a unique feature of GaInNAs and is due to the band structure and band alignment of the material system.

Paper Details

Date Published: 20 December 2004
PDF: 6 pages
Proc. SPIE 5577, Photonics North 2004: Optical Components and Devices, (20 December 2004); doi: 10.1117/12.567550
Show Author Affiliations
Greg Pakulski, Institute for Microstructural Sciences/NRC (Canada)
James A. Gupta, Institute for Microstructural Sciences/NRC (Canada)
Pedro J. Barrios, Institute for Microstructural Sciences/NRC (Canada)
Andre Delage, Institute for Microstructural Sciences/NRC (Canada)
Daniel Poitras, Institute for Microstructural Sciences/NRC (Canada)
Xiaohua Wu, Institute for Microstructural Sciences/NRC (Canada)
Edith Post, Institute for Microstructural Sciences/NRC (Canada)
Zbigniew R. Wasilewski, Institute for Microstructural Sciences/NRC (Canada)

Published in SPIE Proceedings Vol. 5577:
Photonics North 2004: Optical Components and Devices
John C. Armitage; Simon Fafard; Roger A. Lessard; George A. Lampropoulos, Editor(s)

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