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Proceedings Paper

Recollision electron diffraction: measuring the geometry of molecules with their own electrons
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Proc. SPIE 5579, Photonics North 2004: Photonic Applications in Telecommunications, Sensors, Software, and Lasers, ; doi: 10.1117/12.567479
Show Author Affiliations
Daniel Comtois, National Research Council Canada (Canada)
INRS-Énergie, Matériaux et Télécommunications (Canada)
Igor Litvinyuk, National Research Council Canada (Canada)
Kevin F. Lee, National Research Council Canada (Canada)
McMaster Univ. (Canada)
Patrick W Dooley, National Research Council Canada (Canada)
Jean-Claude Kieffer, Univ. du Québec (Canada)
Henri Pépin, Univ. du Québec (Canada)
David M Villeneuve, National Research Council Canada (Canada)
Paul B Corkum, National Research Council Canada (Canada)


Published in SPIE Proceedings Vol. 5579:
Photonics North 2004: Photonic Applications in Telecommunications, Sensors, Software, and Lasers

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