Share Email Print
cover

Proceedings Paper

Crystal growth, characterization, and testing of Cd0.9Zn0.1Te single crystals for radiation detectors
Author(s): Krishna C. Mandal; Caleb Noblitt; Michael Choi; R. David Rauh; Utpal N. Roy; Michael Groza; Arnold Burger; David Eugene Holcomb; Gerald E. Jellison
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

This paper describes our recent research in growing large single crystals of Cd0.9Zn0.1Te (CZT) by the vertical Bridgman technique using in-house processed zone refined precursor materials (Cd, Zn, and Te). The grown semi-insulating CZT crystals have shown high promise for high-resolution room-temperature radiation detectors due to their high dark resistivity (~1010 Ωcm), reasonably good charge transport properties [(μτ)e = (2-5) x 10-3 cm2/V] and low cost. The grown CZT single crystals (~2.5 cm diameter and up to 10 cm long) have demonstrated a very low radial Zn concentration deviation, low dislocation densities and Te precipitate/inclusions, and high infrared transmission. Details of the CZT single crystal growth, their physical and chemical analysis, surface processing, nuclear radiation detector fabrication, and testing of these devices are also presented.

Paper Details

Date Published: 21 October 2004
PDF: 10 pages
Proc. SPIE 5540, Hard X-Ray and Gamma-Ray Detector Physics VI, (21 October 2004); doi: 10.1117/12.566936
Show Author Affiliations
Krishna C. Mandal, EIC Labs., Inc. (United States)
Caleb Noblitt, EIC Labs., Inc. (United States)
Michael Choi, EIC Labs., Inc. (United States)
R. David Rauh, EIC Labs., Inc. (United States)
Utpal N. Roy, Fisk Univ. (United States)
Michael Groza, Fisk Univ. (United States)
Arnold Burger, Fisk Univ. (United States)
David Eugene Holcomb, Oak Ridge National Lab. (United States)
Gerald E. Jellison, Oak Ridge National Lab. (United States)


Published in SPIE Proceedings Vol. 5540:
Hard X-Ray and Gamma-Ray Detector Physics VI
Arnold Burger; Ralph B. James; Larry A. Franks, Editor(s)

© SPIE. Terms of Use
Back to Top