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Proceedings Paper

Application of OCT to examination of easel paintings
Author(s): Haida Liang; Rada Cucu; George M. Dobre; David A. Jackson; Justin Pedro; Christopher Pannell; David Saunders; Adrian Gh. Podoleanu
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Paper Abstract

We present results of applying low coherence interferometry to gallery paintings. Infrared low coherence interferometry is capable of non-destructive examination of paintings in 3D, which shows not only the structure of the varnish layer but also the paint layers.

Paper Details

Date Published: 9 June 2004
PDF: 4 pages
Proc. SPIE 5502, Second European Workshop on Optical Fibre Sensors, (9 June 2004); doi: 10.1117/12.566780
Show Author Affiliations
Haida Liang, National Gallery (United Kingdom)
Rada Cucu, Univ. of Kent/Canterbury (United Kingdom)
George M. Dobre, Univ. of Kent/Canterbury (United Kingdom)
David A. Jackson, Univ. of Kent/Canterbury (United Kingdom)
Justin Pedro, Ophthalmic Technologies Inc. (Canada)
Christopher Pannell, Optronic Labs., Inc. (United States)
David Saunders, National Gallery (United Kingdom)
Adrian Gh. Podoleanu, Univ. of Kent/Canterbury (United Kingdom)


Published in SPIE Proceedings Vol. 5502:
Second European Workshop on Optical Fibre Sensors
Jose Miguel Lopez-Higuera; Brian Culshaw, Editor(s)

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