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Proceedings Paper

LED photometric calibrations at the National Institute of Standards and Technology and future measurement needs of LEDs
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Paper Abstract

Various new light-emitting diodes (LEDs) including white LEDs are being actively developed for solid-state lighting and many other applications, and there are great needs for accurate measurement of various optical quantities of LEDs. Traditional lamp standards do not suffice for specific measurement needs for LEDs. The National Institute of Standards and Technology (NIST) has recently established calibration services for photometric quantities (luminous intensity and luminous flux) of LEDs, but the measurement needs are expanding. This paper covers the current capabilities and services NIST provides for calibration of LEDs and discusses the future needs for optical metrology of LEDs. Work is just completed at NIST to provide official color calibrations of LEDs (chromaticity coordinates, peak wavelength, correlated color temperature, etc.). Another urgent need addressed is radiometric calibration of LEDs, particularly the total radiant flux (watt) of ultraviolet (UV) LEDs used to excite phosphors for white LEDs. Also, as spectroradiometers coupled with an integrating sphere are increasingly used total spectral radiant flux standards from NIST are in urgent demand. Presented is the scope of NIST plans to realize these new radiometric calibration capabilities for LEDs in the near future.

Paper Details

Date Published: 20 October 2004
PDF: 11 pages
Proc. SPIE 5530, Fourth International Conference on Solid State Lighting, (20 October 2004); doi: 10.1117/12.566635
Show Author Affiliations
C. Cameron Miller, National Institute of Standards and Technology (United States)
Yuqin Zong, National Institute of Standards and Technology (United States)
Yoshihiro Ohno, National Institute of Standards and Technology (United States)


Published in SPIE Proceedings Vol. 5530:
Fourth International Conference on Solid State Lighting
Ian T. Ferguson; Nadarajah Narendran; Steven P. DenBaars; John C. Carrano, Editor(s)

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