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Proceedings Paper

Nanoscale TEM tomography of metal oxide photocatalyst systems
Author(s): Arlyn J. Antolak; Gene A. Lucadamo
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Paper Abstract

Transmission electron microscope (TEM) tomography provides three-dimensional structural information from tilt series with nanoscale resolution. We have collected TEM projection data sets to study the internal structure of photocatalytic nanoparticles. Multiple cross-sectional slices of the nanoparticles are reconstructed using an algebraic reconstruction technique (ART) and then assembled to form a 3D rendering of the object. We recently upgraded our TEM with a new sample holder having a tilt range of ±70° and have collected tomography data over a range of 125°. Simulations were performed to study the effects of field-of-view displacement (shift and rotation), limited tilt angle range, hollow (missing) projections, stage angle accuracy, and number of projections on the reconstructed image quality. This paper discusses our experimental and computational approaches, presents some examples of TEM tomography, and considers future directions.

Paper Details

Date Published: 26 October 2004
PDF: 8 pages
Proc. SPIE 5541, Penetrating Radiation Systems and Applications VI, (26 October 2004); doi: 10.1117/12.565694
Show Author Affiliations
Arlyn J. Antolak, Sandia National Labs. (United States)
Gene A. Lucadamo, Sandia National Labs. (United States)


Published in SPIE Proceedings Vol. 5541:
Penetrating Radiation Systems and Applications VI
F. Patrick Doty; Richard C. Schirato; H. Bradford Barber; Hans Roehrig, Editor(s)

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