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Proceedings Paper

Inside the ultra-resolution method
Author(s): Evgeni N. Terentiev; Nikolai E. Terentiev; Fedor V. Shugaev
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Paper Abstract

At Faculty of Physics, Moscow State University, the new image processing methods for different physical measuring systems are created. The main feature of the proposed super-, ultra-resolution methods consists in the diminishing of the dimensions of problems under consideration. In super- resolution method every actual (or virtual) ray has its own local vision domain. The local-linear super- resolution problem was solved on the special arranged set of actual (or virtual) rays. The introduced resolving function R [1] was not used. Point Spread Function (PSF) O and resolved O: R*O were needed for the illustration of results of the local-linear super-resolution method [1]. In ultra-resolution (point) method, the resolving function R is directly used on small size vision domains ,and so is PSF O. The ultra-resolution method gives point results. In the super-resolution method each pixel was divided onto 2x2 and 4x4. The method of ultra-resolution gives us practically unlimited capability for "interpolation of pixels". "The pixel interpolation" certainly increases the dimensions of problem, but it enables us to perform a better presentation of the PSF O of the image measuring system. From the point of view of super- resolution method, the number of virtual rays in ultra-resolution method corresponds to the number of the small "interpolated pixels". The new ultra-resolution method is more effective and stable in comparing with the super-resolution method [1]. Numerous applications are considered, too.

Paper Details

Date Published: 22 October 2004
PDF: 12 pages
Proc. SPIE 5574, Remote Sensing for Environmental Monitoring, GIS Applications, and Geology IV, (22 October 2004); doi: 10.1117/12.565610
Show Author Affiliations
Evgeni N. Terentiev, M.V. Lomonosov Moscow State Univ. (Russia)
Nikolai E. Terentiev, XSIA (Russia)
Fedor V. Shugaev, M.V. Lomonosov Moscow State Univ. (Russia)


Published in SPIE Proceedings Vol. 5574:
Remote Sensing for Environmental Monitoring, GIS Applications, and Geology IV
Manfred Ehlers; Francesco Posa, Editor(s)

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