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Proceedings Paper

Application of point-diffraction interferometry to testing infrared imaging systems
Author(s): Raymond N. Smartt; Gonzalo Paez
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Paper Abstract

Point-diffraction interferometry has found wide applications spanning much of the electromagnetic spectrum, including both near- and far-infrared wavelengths. Any telescopic, spectroscopic or other imaging system that converts an incident plane or spherical wavefront into an accessible point-like image can be tested at an intermediate image plane or at the principal image plane, in situ. Angular field performance can be similarly tested with inclined incident wavefronts. Any spatially coherent source can be used, but because of the available flux, it is most convenient to use a laser source. The simplicity of the test setup can allow testing of even large and complex fully-assembled systems. While purely reflective IR systems can be conveniently tested at visible wavelengths (apart from filters), catadioptric systems could be evaluated using an appropriate source and an IRPDI, with an imaging and recording system. PDI operating principles are briefly reviewed, and some more recent developments and interesting applications briefly discussed. Alternative approaches and recommended procedures for testing IR imaging systems, including the thermal IR, are suggested. An example of applying point-diffraction interferometry to testing a relatively low angular-resolution, optically complex IR telescopic system is presented.

Paper Details

Date Published: 4 November 2004
PDF: 13 pages
Proc. SPIE 5543, Infrared Spaceborne Remote Sensing XII, (4 November 2004); doi: 10.1117/12.565464
Show Author Affiliations
Raymond N. Smartt, National Solar Observatory/Sacramento Peak (United States)
Gonzalo Paez, Ctr. de Investigaciones en Optica, A.C. (Mexico)

Published in SPIE Proceedings Vol. 5543:
Infrared Spaceborne Remote Sensing XII
Marija Strojnik, Editor(s)

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