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Proceedings Paper

Convergence of phase inversion for simple crystal shapes using coherent x-ray diffraction
Author(s): Garth J. Williams; Mark A. Pfeifer; Ivan A. Vartaniants; Ian K. Robinson
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Paper Abstract

The penetrating nature and atomic-scale wavelength of X-ray radiation makes the possibility of an X-ray microscope a very exciting prospect. Unfortunately, existing X-ray optics are far less efficient than their visible light counterparts. An attractive alternative to optics is computational inversion of the far-field coherent X-ray diffraction (CXD), which can be measured using modern X-ray sources. Thus we seek to defeat the so-called phase problem by iteratively seeking a set of phases consistent with the CXD measurement and some physical real-space constraints. We have found the behavior of fitting algorithms to be qualitatively different for simulated diffraction patterns and measured coherent X-ray intensity patterns. We will compare the convergence of the inversion of CXD patterns from simply shaped metal crystals with simulation.

Paper Details

Date Published: 22 October 2004
PDF: 10 pages
Proc. SPIE 5562, Image Reconstruction from Incomplete Data III, (22 October 2004); doi: 10.1117/12.565062
Show Author Affiliations
Garth J. Williams, Univ. of Illinois/Urbana-Champaign (United States)
Mark A. Pfeifer, Univ. of Illinois/Urbana-Champaign (United States)
Ivan A. Vartaniants, Univ. of Illinois/Urbana-Champaign (Russia)
Ian K. Robinson, Univ. of Illinois/Urbana-Champaign (United States)


Published in SPIE Proceedings Vol. 5562:
Image Reconstruction from Incomplete Data III
Philip J. Bones; Michael A. Fiddy; Rick P. Millane, Editor(s)

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