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Proceedings Paper

Spectroscopic infrared ellipsometry
Author(s): A. Roseler
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Paper Abstract

The spectroscopic infrared ellipsometry (SIRE) by means of the combination of a photometric ellipsometer with a Fourier transform spectrometer is used to measure optical properties in the infrared. From the observed four Stokes parameters, the spectrum of the degree of polarization after the reflection at the sample is calculated and discussed.

Paper Details

Date Published: 1 March 1992
PDF: 2 pages
Proc. SPIE 1575, 8th Intl Conf on Fourier Transform Spectroscopy, (1 March 1992); doi: 10.1117/12.56467
Show Author Affiliations
A. Roseler, Zentralinstitut fuer Optik und Spektroskopie (Germany)

Published in SPIE Proceedings Vol. 1575:
8th Intl Conf on Fourier Transform Spectroscopy
Herbert Michael Heise; Ernst Heiner Korte; Heinz W. Siesler, Editor(s)

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