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Proceedings Paper

Error rate in current-controlled logic processors with shot noise
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Paper Abstract

The error rate in a current-controlled logic processor dominated by shot noise has been investigated. It is shown that the error rate increases very rapidly with increasing cutoff frequency. The maximum clock frequency of the processor, which works without errors, is obtained as a function of the on-state current. The information channel capacity of the system is also studied.

Paper Details

Date Published: 25 May 2004
PDF: 4 pages
Proc. SPIE 5472, Noise and Information in Nanoelectronics, Sensors, and Standards II, (25 May 2004); doi: 10.1117/12.564330
Show Author Affiliations
Jong U. Kim, Texas A&M Univ. (United States)
Laszlo B. Kish, Texas A&M Univ. (United States)


Published in SPIE Proceedings Vol. 5472:
Noise and Information in Nanoelectronics, Sensors, and Standards II
Janusz M. Smulko; Yaroslav Blanter; Mark I. Dykman; Laszlo B. Kish, Editor(s)

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