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Proceedings Paper

Fourier spectroscopy of superthin films on metals: comparison of surface electromagnetic waves spectroscopy and reflection-absorption spectroscopy
Author(s): N. Yu. Gushanskaya; Valery A. Voronin; V. A. Yakovlev; Guerman N. Zhizhin
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Paper Abstract

Theoretical and experimental comparison of the sensitivity of two non-destructive methods (SEWS and RAS) has proved that in the linear approximation for super-thin films, the sensitivity of SEWS is higher than RAS and is increasing with the increase of the relation (root)/(root)(tau ) ((root) equals film frequency absorption band, (root)(tau ) equals collision frequency of free carriers in the metal).

Paper Details

Date Published: 1 March 1992
PDF: 2 pages
Proc. SPIE 1575, 8th Intl Conf on Fourier Transform Spectroscopy, (1 March 1992); doi: 10.1117/12.56418
Show Author Affiliations
N. Yu. Gushanskaya, Polytechnic Institute (Ukraine)
Valery A. Voronin, Polytechnic Institute (Ukraine)
V. A. Yakovlev, Institute of Spectroscopy (Russia)
Guerman N. Zhizhin, Institute of Spectroscopy (Russia)


Published in SPIE Proceedings Vol. 1575:
8th Intl Conf on Fourier Transform Spectroscopy

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