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Proceedings Paper

New results from performance studies of Frisch-grid CdZnTe detectors
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Paper Abstract

New data regarding performance studies of Frish-grid CdZnTe (CZT) detectors are presented. The Frisch-grid detector configuration under investigation is a bar shaped CZT crystal with teh side surfaces coated with an insulating layer. A Frisch grid is fashioned by inserting the CZT bar into a metallic sleeve, or by depositing the metal directly upon the insulator; hence the semiconductor material does not come in contact with the metal grid. The simple design operates well as a single-carrier-sensitive device. Despite the simplicity of this device, its performance depends on the balanced combinations of several factors, including the bulk and surface conductivity, μτ product, and geometrical aspect ratio. Described are several effects that determine charge collection in such drift devices and, consequently, the performance of the non-contacting Frisch-grid configuration.

Paper Details

Date Published: 21 October 2004
PDF: 13 pages
Proc. SPIE 5540, Hard X-Ray and Gamma-Ray Detector Physics VI, (21 October 2004); doi: 10.1117/12.563393
Show Author Affiliations
Aleksey E. Bolotnikov, Brookhaven National Lab. (United States)
Giuseppe S. Camarda, Brookhaven National Lab. (United States)
Gabriella A. Carini, Brookhaven National Lab. (United States)
Gomez W. Wright, Brookhaven National Lab. (United States)
Douglas Scott McGregor, Kansas State Univ. (United States)
Walter McNeil, Kansas State Univ. (United States)
Ralph B. James, Brookhaven National Lab. (United States)

Published in SPIE Proceedings Vol. 5540:
Hard X-Ray and Gamma-Ray Detector Physics VI
Arnold Burger; Ralph B. James; Larry A. Franks, Editor(s)

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