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Proceedings Paper

Quantum states estimation: root approach
Author(s): Yu. I. Bogdanov
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Paper Abstract

Multiparametric statistical model providing stable reconstruction of parameters by observations is considered. The only general method of this kind is the root model based on the representation of the probability density as a squared absolute value of a certain function, which is referred to as a psi-function in analogy with quantum mechanics. The psi-function is represented by an expansion in terms of an orthonormal set of functions. It is shown that the introduction of the psi-function allows one to represent the Fisher information matrix as well as statistical properties of the estimator of the state vector (state estimator) in simple analytical forms. A new statistical characteristic, a confidence cone, is introduced instead of a standard confidence interval. The chi-square test is considered to test the hypotheses that the estimated vector converges to the state vector of a general population and that both samples are homogeneous. The expansion coefficients are estimated by the maximum likelihood method. The method proposed may be applied to its full extent to solve the statistical inverse problem of quantum mechanics (root estimator of quantum states). In order to provide statistical completeness of the analysis, it is necessary to perform measurements in mutually complementing experiments (according to the Bohr terminology). The maximum likelihood technique and likelihood equation are generalized in order to analyze quantum mechanical experiments. It is shown that the requirement for the expansion to be of a root kind can be considered as a quantization condition making it possible to choose systems described by quantum mechanics from all statistical models consistent, on average, with the laws of classical mechanics.

Paper Details

Date Published: 28 May 2004
PDF: 10 pages
Proc. SPIE 5401, Micro- and Nanoelectronics 2003, (28 May 2004); doi: 10.1117/12.562729
Show Author Affiliations
Yu. I. Bogdanov, OAO Angstrem (Russia)


Published in SPIE Proceedings Vol. 5401:
Micro- and Nanoelectronics 2003
Kamil A. Valiev; Alexander A. Orlikovsky, Editor(s)

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