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Proceedings Paper

Magnetic force microscopy of magnetization reversal of microstructures in situ in the external field of up to 2000Oe
Author(s): Anastas A. Bukharaev; Dmitrii A. Biziaev; Pavel A. Borodin; Denis V. Ovchinnikov
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Paper Abstract

This work is devoted to the investigation of the magnetization reversal of microstructures directly in the magnetic force microscope (MFM) when the external field on the sample is created with an electromagnet installed into the microscope. By using special samples containing Co ferromagnetic micropatterns it was shown that the magnetization reversal of the tip of the microscope in the high magnetic field led to the essential transformation of the MFM images of planar magnetic microstructures. The computer simulation of the corresponding MFM images confirmed this conclusion. The analysis of the experimental MFM images of Co micropatterns obtained at the magnetic field in the range from -2000 up to 2000 Oe allowed us to estimate the coercivity of magnetic tips. The knowledge about the tip magnetic properties and computer simulation gave a possibility to interpret the MFM images of the samples in the strong magnetic field more correctly.

Paper Details

Date Published: 28 May 2004
PDF: 6 pages
Proc. SPIE 5401, Micro- and Nanoelectronics 2003, (28 May 2004); doi: 10.1117/12.562698
Show Author Affiliations
Anastas A. Bukharaev, E.K. Zavoisky Physical-Technical Institute (Russia)
Dmitrii A. Biziaev, E.K. Zavoisky Physical-Technical Institute (Russia)
Pavel A. Borodin, E.K. Zavoisky Physical-Technical Institute (Russia)
Denis V. Ovchinnikov, E.K. Zavoisky Physical-Technical Institute (Russia)

Published in SPIE Proceedings Vol. 5401:
Micro- and Nanoelectronics 2003
Kamil A. Valiev; Alexander A. Orlikovsky, Editor(s)

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