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Proceedings Paper

Long-term stability of UV multifilter rotating shadowband radiometers: part 2. Lamp calibrations versus the Langley method
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Paper Abstract

This is the second continuation of work begun by Dave Bigelow and James Slusser in their study of the same name published in 2000 in J. Geophys. Res., 105, 4833-4840, which studied only a few instruments over a limited in-service time span. Part 1 expanded the Langley stability analysis by using 42 instruments over 5 years of field service. This part 2 expands stability as expressed with repeated laboratory lamp calibrations of the instruments, and compares these to the prior Langley analysis. 115 cases representing 44 instruments covering seven years of deployment are studied. Complicating this analysis are the four versions of the UV-MFRSR instrument that span the analysis time frame, and the results are presented as such. These results show the mean annual drift in sensitivity for the seven nominal wavelengths of the UV-MFRSR instrument are: pre-Rev.M: 300nm -8.8%, 305nm -8.1%, 311nm -7.4%, 317nm -8.3%, 325nm -7.3%, 332nm -7.6%, 368nm -7.2%; Rev.M: 300nm -7.5%, 305nm -7.1%, 311nm -6.5%, 317nm -5.6%, 325nm -5.8%, 332nm -5.3%, 368nm -5.1%; Rev.N and P; 300nm -10.1%, 305nm -7.2%, 311nm -8.3%, 317nm -4.3%, 325nm -3.6%, 332nm -3.7%, 368nm -3.5%; and Rev.Q: 300nm -5.6%, 305nm -5.8%, 311nm -3.8%, 317nm -4.4%, 325nm -4.8%, 332nm -4.6%, 368nm -3.5%.

Paper Details

Date Published: 14 October 2004
PDF: 6 pages
Proc. SPIE 5545, Ultraviolet Ground- and Space-based Measurements, Models, and Effects IV, (14 October 2004); doi: 10.1117/12.562491
Show Author Affiliations
George T. Janson, Colorado State Univ. (United States)
James R. Slusser, Colorado State Univ. (United States)
Gwen Scott, Colorado State Univ. (United States)
Patrick Disterhoft, National Oceanic and Atmospheric Administration (United States)
Kathleen Lantz, National Oceanic and Atmospheric Administration (United States)


Published in SPIE Proceedings Vol. 5545:
Ultraviolet Ground- and Space-based Measurements, Models, and Effects IV
James R. Slusser; Jay R. Herman; Wei Gao; Germar Bernhard, Editor(s)

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