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Proceedings Paper

Correction techniques for 2D detectors to be used with high-energy x-ray sources for CT, part II
Author(s): Bernhard J. Illerhaus; Yener Onel; Jurgen Goebbels
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Paper Abstract

In 1997 we presented some correction techniques for image intensifier images. In the mean time flat panel detectors are often used instead of. The visible contrast of the 16bit flat panel is much higher then with the same digitisation from intensifier images. This misleads users of CT-systems with flat panel detectors to expect far better results. Nevertheless all of the previously described corrections have to be done here too, if an artefact free image is the aim. This gets most important, if an automated evaluation shall be used to extract features from CT images. The main advantage of the new proposed correction technique is that the detector intrinsic scattered radiation (stray light) is corrected with a fast two dimensional filter. Also the right interaction with other corrections like beam hardening and object-scattered radiation is of importance, examples will be shown. The corrected 2D detector images enhances the quality of cone beam CT results in respect to their geometrical distinctness so that geometrical measurements and reverse engineering results get comparable with 2D CT measurements. Results are shown on the µ-CT scanner for bigger objects or for objects with higher X-ray absorption which was set up at BAM. The system is equipped with a bipolar 320kV micro focus tube and a flat panel detector of amorphous Si with 400mm side length, room and system temperatures are regulated.

Paper Details

Date Published: 26 October 2004
PDF: 6 pages
Proc. SPIE 5535, Developments in X-Ray Tomography IV, (26 October 2004); doi: 10.1117/12.562284
Show Author Affiliations
Bernhard J. Illerhaus, Bundesanstalt fur Materialforschung und -prufung (Germany)
Yener Onel, Bundesanstalt fur Materialforschung und -prufung (Germany)
Jurgen Goebbels, Bundesanstalt fur Materialforschung und -prufung (Germany)

Published in SPIE Proceedings Vol. 5535:
Developments in X-Ray Tomography IV
Ulrich Bonse, Editor(s)

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