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Proceedings Paper

High-resolution x-ray spectroscopy of optically-thin sources
Author(s): Frits B. S. Paerels
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Paper Abstract

High resolution X-ray spectroscopy of optically thin sources is discussed. Based on a brief description of the general properties of highly ionized, optically thin sources and their spectra, and a set of specific examples drawn from the recent literature, I outline arguments for the importance of routine spectroscopy of faint sources as a science driver for future missions.

Paper Details

Date Published: 11 October 2004
PDF: 11 pages
Proc. SPIE 5488, UV and Gamma-Ray Space Telescope Systems, (11 October 2004); doi: 10.1117/12.561499
Show Author Affiliations
Frits B. S. Paerels, Columbia Univ. (United States)


Published in SPIE Proceedings Vol. 5488:
UV and Gamma-Ray Space Telescope Systems
Guenther Hasinger; Martin J. L. Turner, Editor(s)

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